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Author Info
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DAVID G. STORK, PhD, is Chief Scientist at Ricoh Innovations, Inc., and Consulting Professor of Electrical Engineering at Stanford University. A graduate of MIT and the University of Maryland, he is the founder and leader of the Open Mind Initiative and the coauthor, with Richard Duda and Peter Hart, of Pattern Classification, Second Edition, as well as four other books.
ELAD YOM-TOV, PhD, is a research scientist at IBM Research Lab in Haifa, working on the applications of machine learning to search technologies, bioinformatics, and hardware verification (among others). He is a graduate of Tel-Aviv University and the Technion.
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