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Semiconductor Material and Device Characterization, 3rd Edition
Semiconductor Material and Device Characterization, 3rd Edition
Dieter K. Schroder, Arizona State Univ.
ISBN: 978-0-471-73906-7
©2006
800 pages
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STUDENTS
TITLE INFORMATION
Description  |  Author Info  |  Table of Contents  |  New to This Edition  |  Hallmark Features  |  Reviewer Comments
New to This Edition
  • Updated and revised figures and examples reflecting the most current data and information
  • 260 new references offering access to the latest research and discussions in specialized topics
  • Revisions and updated sections in each chapter
  • Two new chapters: Charge-Based and Probe Characterization and Reliability and Failure Analysis
  • New problems and review questions at the end of each chapter to test students understanding
 

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