Wiley Publishers Since 1807   Shopping Cart  Shopping Cart  My Account  Help  Contact Us  
Home Technology Solutions Who's My Rep About Wiley
 
Product Search
Home > Engineering and Computer Science > Electrical Engineering > Electronic Properties of Materials
Semiconductor Material and Device Characterization, 3rd Edition
Semiconductor Material and Device Characterization, 3rd Edition
Dieter K. Schroder, Arizona State Univ.
ISBN: 978-0-471-73906-7
©2006
800 pages
INSTRUCTORS
STUDENTS
TITLE INFORMATION
Description  |  Author Info  |  Table of Contents  |  New to This Edition  |  Hallmark Features  |  Reviewer Comments
Reviewer Comments
"I strongly recommend this book for those who want to learn device characterization." (IEEE Circuits & Devices Magazine, November/December 2006)  

Printer-ready version of this page E-mail a friend about this product

Copyright © 2000-2008 by John Wiley & Sons, Inc. or related companies. All rights reserved. Please read our Privacy Policy